VWR Hitachi UH4150, UV-Vis/NIR spectrophotometers
SKU : 634-0951
Direct light detecting system
UH4150
These UV-Vis/NIR spectrophotometers offer enormous flexibility for the evaluation and quality control of solid samples, typically optical components or coated surfaces. They can be configured for non destructive measurements when equipped with relevant accessories for applications such as:
- Micro sample reflectance
- Wafer reflectance/transmission
- Optical thin film reflection
- Lens transmittance
- Solar cells and coated glass evaluation
High precision accessories can measure at a range of incident angles.
For coated glass surfaces, the variable angle absolute reflectance accessory (20 to 60�) measures the absolute reflectance and transmittance at a desired angle by rotating the detector and the sample stage independently.
Ordering information: For more information on the range of accessories, please contact your local Avantor agency.
